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Zernike polynomials are universal in optical modeling and testing of wavefronts; however, their polynomial behavior can cause a misinterpretation of individual aberrations. Wavefront profiles described by Zernike polynomials contain multiple terms with different orders of pupil radius (ρ). Angiogenesis antagonist Zernike polynomials are a sum of high and low orders of ρ to minimize the RMS wavefront error and to preserve orthogonality. Since the low-order polynomials are still contained in the net Zernike sum, there is redundancy in individual monomials. Monomial aberrations, also known as Seidel or primary aberrations, are useful in studying an optical design's complexity, alignment, and field behavior. Zernike polynomial aberrations reported by optical design software are not indicative of individual (monomial) aberrations in wide field of view designs since the low-order polynomials are contaminated by higher order terms. An aberration node is the field location where an individual (monomial) aberration is zero. In this paper, a matrix method is shown to calculate the individual monomial aberrations given the set of Zernike polynomials. Monomial aberrations plotted as a function of field angle (H) indicate the field order (Hn) and the location of true aberration nodes. Contrarily, Zernike polynomial versus field (ZvF) plots can indicate false aberration nodes, due to the polynomial mixing of high- and low-order terms. Accurate knowledge of the monomial aberration nodes, converted from Zernike polynomials, provides the link between a ray-trace model or lab wavefront measurement and nodal aberration theory (NAT). This method is applied to two different optical designs (1) 120° circular FOV fish-eye lens and (2) 120∘×4∘ rectangular FOV, off-axis, freeform four-mirror design.Patterned color filter arrays are important components in digital cameras, camcorders, scanners, and multispectral detection and imaging instruments. In addition to the rapid and continuous progress to improve camera resolution and the efficiency of imaging sensors, research into the design of color filter arrays is important to extend the imaging capability beyond conventional applications. This paper reports the use of colored SU-8 photoresists as a material to fabricate color filter arrays. Optical properties, fabrication parameters, and pattern spatial resolution are systematically studied for five color photoresists violet, blue, green, yellow, and red. An end-to-end fabrication process is developed to realize a five-color filter array designed for a wide angle multiband artificial compound eye camera system for pentachromatic and polarization imaging. Colored SU-8 photoresists present notable advantages, including patternability, color tunability, low-temperature compatibility, and process simplicity. The results regarding the optical properties and the fabrication process for a colored SU-8 photoresist provide significant insight into its usage as an optical material to investigate nonconventional color filter designs.We present a process to locate the desired local optimum of high-dimensional design problems such as the optimization of freeform mirror systems. By encoding active design variables into a binary vector imitating DNA sequences, we are able to perform a genetic optimization of the optimization process itself. The end result is an optimization route that is effectively able to sidestep local minima by warping the variable space around them in a way that mimics the expertise of veteran designers. The generality of the approach is validated through the automated generation of high-performance designs for off-axis three- and four-mirror free-form systems.The concept of curvature sensing is reviewed, and a comprehensive derivation of the curvature polynomials is given, whose inner products with the wavefront curvature data yield the Zernike aberration coefficients of an aberrated circular wavefront. The data consist of the Laplacian of the wavefront across its interior and its outward normal slope at its circular boundary. However, we show that the radial part of the curvature polynomials and their slopes at the boundary of the wavefront have a value of zero, except when the angular frequency of the corresponding Zernike polynomial is equal to its radial degree. As a result, the effect of noise on the corresponding Zernike coefficients is lower because the noisy data at the boundary of the wavefront is not used to determine their values. The use of the curvature polynomials to determine the Zernike coefficients is demonstrated with simulated noisy curvature data of an aberration function consisting of 10 Zernike coefficients, namely defocus, primary, secondary, and tertiary astigmatism, coma, and spherical aberrations.Semiconductor microcavities are frequently studied in the context of semiconductor lasers and in application-oriented fundamental research on topics such as linear and nonlinear polariton systems, polariton lasers, polariton pattern formation, and polaritonic Bose-Einstein condensates. A commonly used approach to describe theoretical properties includes a phenomenological single-mode equation that complements the equation for the nonlinear optical response (interband polarization) of the semiconductor. Here, we show how to replace the single-mode equation by a fully predictive transfer function method that, in contrast to the single-mode equation, accounts for propagation, retardation, and pulse-filtering effects of the incident light field traversing the distributed Bragg reflector (DBR) mirrors, without substantially increasing the numerical complexity of the solution. As examples, we use cavities containing GaAs quantum wells and transition-metal dichalcogenides (TMDs).We demonstrate feedback cooling of a millimeter-scale, 40 kHz SiN membrane from room temperature to 5 mK (3000 phonons) using a Michelson interferometer, and discuss the challenges to ground-state cooling without an optical cavity. This advance appears within reach of current membrane technology, positioning it as a compelling alternative to levitated systems for quantum sensing and fundamental weak force measurements.